Current instabilities in the Auger transistorOSTROUMOVA, E. V; ROGACHEV, A. A.International conference on microelectronic. 1997, pp 277-280, isbn 0-7803-3664-X, 2VolConference Paper

Electron states of ultrathin crystalsMIRJANIC, D. L; SETRAJBIC, J. P; STOJKOVIC, S. M et al.International conference on microelectronic. 1997, pp 121-124, isbn 0-7803-3664-X, 2VolConference Paper

In tunnel-MIS junctionGREKHOV, I. V; SHULEKIN, A. F; VEXLER, M. I et al.International conference on microelectronic. 1997, pp 165-168, isbn 0-7803-3664-X, 2VolConference Paper

Influence of assembling procedure on IC parametersMANIC, D; FRIEDRICH, A. P; HADDAB, Y et al.International conference on microelectronic. 1997, pp 637-640, isbn 0-7803-3664-X, 2VolConference Paper

Micromachined millimeter-wave technologySAINT-ETIENNE, E; GUILLON, B; PONS, P et al.International conference on microelectronic. 1997, pp 519-522, isbn 0-7803-3664-X, 2VolConference Paper

Multi-valued simulation of digital circuitsUBAR, R.International conference on microelectronic. 1997, pp 721-724, isbn 0-7803-3664-X, 2VolConference Paper

MIEL '97 : 21st international conference on microelectronics (Nis, 14-17 September 1997)International conference on microelectronic. 1997, isbn 0-7803-3664-X, 2Vol, XVI, 852 p, isbn 0-7803-3664-XConference Proceedings

Current status of failure analysis for ULSIsNAKAJIMA, S; UEKI, T; SHIONOYA, Y et al.International conference on microelectronic. 1997, pp 591-598, isbn 0-7803-3664-X, 2VolConference Paper

Design of a SOI memory cellSTANOJEVIC, Z; IOANNOU, D. E; LONCAR, B et al.International conference on microelectronic. 1997, pp 297-300, isbn 0-7803-3664-X, 2VolConference Paper

Quantum approach to GaAs MESFETsSALIC, R; RAMOVIC, R; TJAPKIN, D et al.International conference on microelectronic. 1997, pp 365-368, isbn 0-7803-3664-X, 2VolConference Paper

Room-temperature quantum-constriction rectifierSORDAN, R; NIKOLIC, K.International conference on microelectronic. 1997, pp 137-140, isbn 0-7803-3664-X, 2VolConference Paper

Symbolic analysis of programmable digital filtersLUTOVAC, M. D; TOSIC, D. V; EVANS, B. L et al.International conference on microelectronic. 1997, pp 713-716, isbn 0-7803-3664-X, 2VolConference Paper

Market oriented development and production of microdevicesEHRFELD, W; HESSEL, V; KÄMPER, K.-P et al.International conference on microelectronic. 1997, pp 71-79, isbn 0-7803-3664-X, 2VolConference Paper

Yugoslavia in the global microelectronics worldPENN, M. G.International conference on microelectronic. 1997, pp 3-10, isbn 0-7803-3664-X, 2VolConference Paper

Novel floating-impedance converter using CCII+HOU, C.-L; YEAN, R; WANG, W.-Y et al.International conference on microelectronic. 1997, pp 763-765, isbn 0-7803-3664-X, 2VolConference Paper

Analysis of thick film thermistor geometriesALEKSIC, O. S; NIKOLIC, P. M; JOKIC, V. D et al.International conference on microelectronic. 1997, pp 431-434, isbn 0-7803-3664-X, 2VolConference Paper

Faraday cell optimizationBANDIC, J. R; MASANOVC, G. Z; RADUNOVIC, J. B et al.International conference on microelectronic. 1997, pp 573-576, isbn 0-7803-3664-X, 2VolConference Paper

Micro fabricated biosensors and microsystemsHESKETH, P. J; ZIVANOVIC, S; WILSON, G. S et al.International conference on microelectronic. 1997, pp 63-69, isbn 0-7803-3664-X, 2VolConference Paper

On the extraction of the threshold voltage of MOSFETsORTIZ-CONDE, A; GOUVEIA FERNANDES, E; LIOU, J. J et al.International conference on microelectronic. 1997, pp 285-288, isbn 0-7803-3664-X, 2VolConference Paper

Reliability testing of power VDMOS transistorsTOSIC, N; PESIC, B; STOJADINOVIC, N et al.International conference on microelectronic. 1997, pp 667-670, isbn 0-7803-3664-X, 2VolConference Paper

Simulation of electrical burnout of MOSFET structuresVASHCHENKO, V. A; MARTYNOV, Y. B; SINKEVITCH, V. F et al.International conference on microelectronic. 1997, pp 467-470, isbn 0-7803-3664-X, 2VolConference Paper

Technology CAD : Process and device simulationKOSINA, H; SELBERHERR, S.International conference on microelectronic. 1997, pp 441-450, isbn 0-7803-3664-X, 2VolConference Paper

The measurement of minimotors and micromotors torque characteristicBRENNER, W; HADDAD, G; POPOVIC, G et al.International conference on microelectronic. 1997, pp 535-538, isbn 0-7803-3664-X, 2VolConference Paper

On the extraction of the effective channel length of MOSFETsLATIF, Z; ORTIZ-CONDE, A; LIOU, J. J et al.International conference on microelectronic. 1997, pp 281-284, isbn 0-7803-3664-X, 2VolConference Paper

What could a virtual wafer look like?HALAMA, S.International conference on microelectronic. 1997, pp 49-56, isbn 0-7803-3664-X, 2VolConference Paper